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Code
Description
Unit
NIST-674b
X-Ray Powder Diffraction Intensity Set (Quantitative Powder Diffraction Standard)
10 g (powder)
NIST-3600
Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering
coupon
NIST-1979
Powder Diffraction Line Profile Standard for Crystallite Size Analysis (Nano-Crystalline ZnO Powder)
2 x 3 g
BAM-EDS-TM002 with Software (Multiple license)
Test material for the performance check of an X-ray spectrometer attached to a SEM, compact material, dimensions 8 mm x 8 mm x 0,5 mm + CD-ROM (in English und German)
ea
BAM-EDS-TM002 with Software (Individual license)
Test material for the performance check of an X-ray spectrometer attached to a SEM, compact material, dimensions 8 mm x 8 mm x 0,5 mm + CD-ROM (in English und German)
ea
BAM-EDS-TM002
Test material for the performance check of an X-ray spectrometer attached to a SEM, compact material, dimensions 8 mm x 8 mm x 0,5 mm
ea
NIST-640e
Silicon powder line position + line shape standard for powder diffraction
7,5 g
NIST-2000
Calibration standard for high-resolution X-Ray Diffraction
1 block
NIST-1995
Standard Sapphire Single Crystal Wafer for Crystalline Orientation
50-mm wafer
NIST-1994
Standard Silicon Single Crystal Wafer for Crystalline Orientation
100-mm wafer